327 search results - page 28 / 66 » Fault emulation: a new approach to fault grading |
DSD
2006
IEEE
14 years 2 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
DFT
2003
IEEE
14 years 1 months ago
2003
IEEE
In the last years, new requirements in terms of vehicle performance increased significantly the amount of on-board electronics, thus raising more concern about safety and fault to...
DSN
2003
IEEE
14 years 1 months ago
2003
IEEE
Abstract: We present a new approach that uses compilerdirected fault-injection for coverage testing of recovery code in Internet services to evaluate their robustness to operating ...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
ITC
1993
IEEE
14 years 2 days ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...