327 search results - page 36 / 66 » Fault emulation: a new approach to fault grading |
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
VTS
2007
IEEE
14 years 2 months ago
2007
IEEE
In this paper, we identify two main bottlenecks in the functional diagnosis flow and propose new ways to overcome these. Our approach completely eliminates the “Primary Input (P...
DFT
2005
IEEE
14 years 1 months ago
2005
IEEE
The present paper proposes a new method for detecting arbitrary faults in a functional circuit when the set of codewords is limited and known in advance. The method is based on im...
ICCAD
1997
IEEE
14 years 5 days ago
1997
IEEE
This paper presents a unique approach to improve yield given a routed layout. Currently after routing has been completed and compacted, it generally proceeds to verification witho...
DAC
1997
ACM
14 years 4 days ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...