327 search results - page 47 / 66 » Fault emulation: a new approach to fault grading |
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...
CDC
2008
IEEE
13 years 10 months ago
2008
IEEE
Abstract-- Detecting and isolating multiple faults is a computationally intense task which typically consists of computing a set of tests, and then computing the diagnoses based on...
SIGSOFT
2007
ACM
14 years 8 months ago
2007
ACM
Finding flaws in security protocol implementations is hard. Finding flaws in the implementations of sensor network security protocols is even harder because they are designed to p...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
— To ensure security and robustness of the next generation of Physically Unclonable Functions (PUFs), we have developed a new methodology for PUF design. Our approach employs int...
ITC
2002
IEEE
14 years 26 days ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...