327 search results - page 56 / 66 » Fault emulation: a new approach to fault grading |
DAC
2008
ACM
14 years 9 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
ICSE
2003
IEEE-ACM
14 years 8 months ago
2003
IEEE-ACM
Software system faults are often caused by unexpected interactions among components. Yet the size of a test suite required to test all possible combinations of interactions can be...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
ICCD
2002
IEEE
14 years 4 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
CISIS
2010
IEEE
2010
IEEE
Computational Grid as an Appropriate Infrastructure for Ultra Large Scale Software Intensive Systems
14 years 2 months ago
—Ultra large scale (ULS) systems are future software intensive systems that have billions of lines of code, composed of heterogeneous, changing, inconsistent and independent elem...