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VTS
2002
IEEE
120views Hardware» more  VTS 2002»
14 years 10 days ago
Test Pattern Generation for Signal Integrity Faults on Long Interconnects
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...
Amir Attarha, Mehrdad Nourani
DAC
2000
ACM
14 years 8 months ago
On switch factor based analysis of coupled RC interconnects
We revisit a basic element of modern signal integrity analysis, the modeling of worst-case coupling capacitance effects within a switch factor (SF) based methodology. We show that...
Andrew B. Kahng, Sudhakar Muddu, Egino Sarto
ASIAMS
2007
IEEE
14 years 1 months ago
XMulator: A Listener-Based Integrated Simulation Platform for Interconnection Networks
Simulation is perhaps the most cost-effective tool to evaluate the operation of a system under design. A flexible, easy to extend, fully object-oriented, and multilayered simulato...
Abbas Nayebi, Sina Meraji, Arash Shamaei, Hamid Sa...
3DIC
2009
IEEE
279views Hardware» more  3DIC 2009»
14 years 2 months ago
Compact modelling of Through-Silicon Vias (TSVs) in three-dimensional (3-D) integrated circuits
Abstract—Modeling parasitic parameters of Through-SiliconVia (TSV) structures is essential in exploring electrical characteristics such as delay and signal integrity (SI) of circ...
Roshan Weerasekera, Matt Grange, Dinesh Pamunuwa, ...
DAC
2008
ACM
14 years 8 months ago
Transistor level gate modeling for accurate and fast timing, noise, and power analysis
Current source based cell models are becoming a necessity for accurate timing and noise analysis at 65nm and below. Voltage waveform shapes are increasingly more difficult to repr...
S. Raja, F. Varadi, Murat R. Becer, Joao Geada