372 search results - page 28 / 75 » Fault simulation on reconfigurable hardware |
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
ICONIP
2007
13 years 10 months ago
2007
Abstract. In neural networks, network faults can be exhibited in different forms, such as node fault and weight fault. One kind of weight faults is due to the hardware or software ...
ICCD
2006
IEEE
14 years 6 months ago
2006
IEEE
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
ATS
2002
IEEE
14 years 2 months ago
2002
IEEE
This paper addresses the problem of locating the stuckopen faults in a manufactured IC with scan flip-flops. Unlike most previous methods that only aim at identifying the faulty s...
ITC
2002
IEEE
14 years 2 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...