372 search results - page 36 / 75 » Fault simulation on reconfigurable hardware |
VTS
2003
IEEE
14 years 2 months ago
2003
IEEE
: This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation [1] is first p...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
ET
2007
13 years 9 months ago
2007
In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...
ISSTA
2009
ACM
14 years 3 months ago
2009
ACM
During testing, the execution of valid cases is only one part of the task. Checking the behavior in boundary situations and in the presence of errors is an equally important subje...
DSD
2006
IEEE
14 years 25 days ago
2006
IEEE
Until now, most cryptography implementations on parallel architectures have focused on adapting the software to SIMD architectures initially meant for media applications. In this ...