372 search results - page 43 / 75 » Fault simulation on reconfigurable hardware |
ITC
1991
IEEE
14 years 20 days ago
1991
IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
ISCA
2012
IEEE
11 years 11 months ago
2012
IEEE
Soft error reliability has become a first-order design criterion for modern microprocessors. Architectural Vulnerability Factor (AVF) modeling is often used to capture the probab...
ICCD
2004
IEEE
14 years 6 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
In this paper, we study the possibility of using logic defect-level prediction models to predict the detection behavior of statistical timing defects. We compare two known logic m...
ICCAD
1995
IEEE
14 years 22 days ago
1995
IEEE
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...