372 search results - page 62 / 75 » Fault simulation on reconfigurable hardware |
VTS
1997
IEEE
14 years 3 days ago
1997
IEEE
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
ETS
2010
IEEE
13 years 6 months ago
2010
IEEE
ÑIn this paper, we present a comparative study on the effects of resistive-bridging defects in the SRAM core-cells, considering different technology nodes. In particular, we analy...
ISCA
2007
IEEE
14 years 2 months ago
2007
IEEE
ACE analysis is a technique to provide an early reliability estimate for microprocessors. ACE analysis couples data from performance models with low level design details to identi...
ISCA
2005
IEEE
14 years 1 months ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
ASAP
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...