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DAC
2008
ACM
14 years 12 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
DAC
2006
ACM
14 years 12 months ago
FLAW: FPGA lifetime awareness
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
Suresh Srinivasan, Prasanth Mangalagiri, Yuan Xie,...
PADL
2009
Springer
14 years 11 months ago
Operational Semantics for Declarative Networking
Declarative Networking has been recently promoted as a high-level programming paradigm to more conveniently describe and implement systems that run in a distributed fashion over a ...
Juan A. Navarro, Andrey Rybalchenko
SSS
2009
Springer
123views Control Systems» more  SSS 2009»
14 years 5 months ago
Scalable P2P Overlays of Very Small Constant Degree: An Emerging Security Threat
In recent years peer-to-peer (P2P) technology has been adopted by Internet-based malware as a fault tolerant and scalable communication medium for self-organization and survival. I...
Márk Jelasity, Vilmos Bilicki
WCNC
2008
IEEE
14 years 5 months ago
Arbutus: Network-Layer Load Balancing for Wireless Sensor Networks
—The hot spot problem is a typical byproduct of the many-to-one traffic pattern that characterizes most wireless sensor networks: the nodes with the best channel to the sink are ...
Daniele Puccinelli, Martin Haenggi