376 search results - page 25 / 76 » Feedback-Directed Random Test Generation |
ITC
1997
IEEE
14 years 16 hour ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
CP
2006
Springer
13 years 11 months ago
2006
Springer
The paper presents a method for generating solutions of a constraint satisfaction problem (CSP) uniformly at random. The main idea is to express the CSP as a factored probability d...
ICDT
1999
ACM
14 years 2 days ago
1999
ACM
A large number of database index structures have been proposed over the last two decades, and little consensus has emerged regarding their relative e ectiveness. In order to empir...
TVLSI
2008
13 years 7 months ago
2008
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
Random test generators are often used to create regression suites on-the-fly. Regression suites are commonly generated by choosing several specifications and generating a number o...