376 search results - page 9 / 76 » Feedback-Directed Random Test Generation |
PKC
1999
Springer
14 years 23 hour ago
1999
Springer
Abstract. Many applications rely on the security of their random number generator. It is therefore essential that such devices be extensively tested for malfunction. The purpose of...
VTS
2002
IEEE
14 years 20 days ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
ECBS
2011
IEEE
12 years 7 months ago
2011
IEEE
Abstract—Software systems are typically large and exhaustive testing of all possible input parameters is usually not feasible. Testers select tests that they anticipate may catch...
MTDT
2000
IEEE
14 years 4 days ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
ITC
1998
IEEE
14 years 18 hour ago
1998
IEEE
This work proposes an approach to generate weighted random patterns which can maximally excite a circuit during its burn-in testing. The approach is based on a probability model a...