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ISQED
2011
IEEE
329views Hardware» more  ISQED 2011»
12 years 11 months ago
New category of ultra-thin notchless 6T SRAM cell layout topologies for sub-22nm
The extent to which the 6T SRAM bit cell can be perpetuated through continued scaling is of enormous technological and economic importance. Understanding the growing limitations i...
Randy W. Mann, Benton H. Calhoun
ISQED
2006
IEEE
94views Hardware» more  ISQED 2006»
14 years 1 months ago
System-Level SRAM Yield Enhancement
It is well known that SRAM constitutes a large portion of modern integrated circuits, with 80% or more of the total transistors being dedicated to SRAM in a typical processor or S...
Fadi J. Kurdahi, Ahmed M. Eltawil, Young-Hwan Park...
ISQED
2008
IEEE
120views Hardware» more  ISQED 2008»
14 years 1 months ago
Error-Tolerant SRAM Design for Ultra-Low Power Standby Operation
We present an error-tolerant SRAM design optimized for ultra-low standby power. Using SRAM cell optimization techniques, the maximum data retention voltage (DRV) of a 90nm 26kb SR...
Huifang Qin, Animesh Kumar, Kannan Ramchandran, Ja...
VLSISP
2008
95views more  VLSISP 2008»
13 years 7 months ago
Design of an H.264/AVC Decoder with Memory Hierarchy and Line-Pixel-Lookahead
This paper describes a novel memory hierarchy and line-pixel-lookahead (LPL) for an H.264/AVC video decoder. The memory system is the bottleneck of most video processors, particula...
Tsu-Ming Liu, Chen-Yi Lee
TVLSI
2010
13 years 2 months ago
SRAM Read/Write Margin Enhancements Using FinFETs
Process-induced variations and sub-threshold leakage in bulk-Si technology limit the scaling of SRAM into sub-32 nm nodes. New device architectures are being considered to improve ...
Andrew Carlson, Zheng Guo, Sriram Balasubramanian,...