79 search results - page 11 / 16 » Finding Failure Causes through Automated Testing |
DSN
2002
IEEE
14 years 15 days ago
2002
IEEE
Traditional problem determination techniques rely on static dependency models that are difficult to generate accurately in today’s large, distributed, and dynamic application e...
IASTEDSEA
2004
13 years 9 months ago
2004
Time pressure and quality issues bring new challenges for developing web-based systems. The ability to analyze quality early in the development life cycle is crucial. Among the te...
GIS
2010
ACM
13 years 6 months ago
2010
ACM
Rensselaer Polytechnic Institute Troy, NY Levee overtopping can lead to failure and cause catastrophic damage, as was the case during Hurricane Katrina. We present a computer simu...
ICCAD
2004
IEEE
14 years 4 months ago
2004
IEEE
— In deep sub-micron technologies, process variations can cause significant path delay and clock skew uncertainties thereby lead to timing failure and yield loss. In this paper,...
REALWSN
2010
13 years 2 months ago
2010
Pre-deployment tests of sensor networks in indoor testbeds can only deliver a very approximate view of the correctness and performance of a deployed sensor network and it is theref...