This paper presents a wrapper and TAM co-optimization method for reuse of SoC functional interconnects to minimize test time under area constraint. The proposed method consists of...
One major issue in designing image processors is to design a memory system that supports parallel access with a simple interconnection network. This paper presents a design method...
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
Ranganathan Sankaralingam, Rama Rao Oruganti, Nur ...
Multiple surface searching with only image intensity information is a difficult job in the presence of high noise and weak edges. We present in this paper a novel method for global...
In many sensing applications we must continuously gather information to provide a good estimate of the state of the environment at every point in time. A robot may tour an environ...
Alexandra Meliou, Andreas Krause, Carlos Guestrin,...