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» Framework for Fault Analysis and Test Generation in DRAMs
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SRDS
1993
IEEE
13 years 11 months ago
Bayesian Analysis for Fault Location in Homogeneous Distributed Systems
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...
Yu Lo Cyrus Chang, Leslie C. Lander, Horng-Shing L...
ICECCS
2002
IEEE
91views Hardware» more  ICECCS 2002»
14 years 10 days ago
Mars Polar Lander Fault Identification Using Model-based Testing
This paper describes the application of the Test Automation Framework on the Mars Polar Lander (MPL) software. The premature shutdown of the descent engine on the MPL spacecraft i...
Mark R. Blackburn, Robert Busser, Aaron Nauman, Ro...
ICCAD
1999
IEEE
148views Hardware» more  ICCAD 1999»
13 years 11 months ago
SAT based ATPG using fast justification and propagation in the implication graph
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
Paul Tafertshofer, Andreas Ganz
GECCO
2004
Springer
145views Optimization» more  GECCO 2004»
14 years 23 days ago
Search Based Automatic Test-Data Generation at an Architectural Level
Abstract. The need for effective testing techniques for architectural level descriptions is widely recognised. However, due to the variety of domain-specific architectural descript...
Yuan Zhan, John A. Clark
DSN
2009
IEEE
14 years 2 months ago
LFI: A practical and general library-level fault injector
Fault injection, a critical aspect of testing robust systems, is often overlooked in the development of generalpurpose software. We believe this is due to the absence of easy-to-u...
Paul Dan Marinescu, George Candea