202 search results - page 14 / 41 » Framework for Fault Analysis and Test Generation in DRAMs |
ISVLSI
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
ICSOC
2010
Springer
13 years 5 months ago
2010
Springer
Abstract. The modularity of Service-oriented Architectures (SOA) allows to establish complex distributed systems comprising e.g., services, clients, brokers, and workflow engines. ...
ESE
2006
13 years 7 months ago
2006
This paper presents results from a comparative evaluation of five combination strategies. Combination strategies are test case selection methods that combine "interesting&quo...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...