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145
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ICCAD
2009
IEEE
15 years 2 months ago
2009
IEEE
This paper accurately considers wire short defects and proposes an algorithm to guarantee IC chip yield rate improvement for redundant wire insertion. Without considering yield ra...
152
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EKNOW
2010
14 years 11 months ago
2010
Nowadays, industry and governments are faced with an increasing number of varying threats concerning the security of their valuable business processes. Due to the vast damage pote...
150
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TVLSI
2010
14 years 11 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
180
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ICDCS
2011
IEEE
14 years 4 months ago
2011
IEEE
Abstract—Jamming attacks and unintentional radio interference are one of the most urgent threats harming the dependability of wireless communication and endangering the successfu...
172
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PPOPP
2009
ACM
16 years 5 months ago
2009
ACM
This paper considers the problem of formal verification of MPI programs operating under a fixed test harness for safety properties without building verification models. In our app...