Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
Profiling an application executing on a microprocessor is part of the solution to numerous software and hardware optimization and design automation problems. Most current profilin...
Mutual information (MI) based image-registration methods that use histograms are known to suffer from the so-called binning problem, caused by the absence of a principled techniqu...
Maximum margin clustering (MMC) has recently attracted considerable interests in both the data mining and machine learning communities. It first projects data samples to a kernel...
Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....
Xin Li, Jiayong Le, Lawrence T. Pileggi, Andrzej J...