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DAC
2007
ACM
14 years 11 months ago
Confidence Scalable Post-Silicon Statistical Delay Prediction under Process Variations
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
Qunzeng Liu, Sachin S. Sapatnekar
DAC
2002
ACM
14 years 11 months ago
A fast on-chip profiler memory
Profiling an application executing on a microprocessor is part of the solution to numerous software and hardware optimization and design automation problems. Most current profilin...
Roman L. Lysecky, Susan Cotterell, Frank Vahid
ISBI
2006
IEEE
14 years 10 months ago
Continuous image representations avoid the histogram binning problem in mutual information based image registration
Mutual information (MI) based image-registration methods that use histograms are known to suffer from the so-called binning problem, caused by the absence of a principled techniqu...
Ajit Rajwade, Arunava Banerjee, Anand Rangarajan
SDM
2009
SIAM
152views Data Mining» more  SDM 2009»
14 years 7 months ago
Multiple Kernel Clustering.
Maximum margin clustering (MMC) has recently attracted considerable interests in both the data mining and machine learning communities. It first projects data samples to a kernel...
Bin Zhao, James T. Kwok, Changshui Zhang
ICCAD
2005
IEEE
107views Hardware» more  ICCAD 2005»
14 years 7 months ago
Projection-based performance modeling for inter/intra-die variations
Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....
Xin Li, Jiayong Le, Lawrence T. Pileggi, Andrzej J...