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ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
14 years 2 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
ITC
1999
IEEE
67views Hardware» more  ITC 1999»
14 years 1 months ago
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
SEMATECH has sponsored a "Test Method Evaluation" study to understand the trade-offs among the most common test methodologies used in the industry[1,2]. This paper prese...
Phil Nigh, David P. Vallett, Atul Patel, Jason Wri...
ICSE
2005
IEEE-ACM
14 years 2 months ago
Observations and lessons learned from automated testing
This report addresses some of our observations made in a dozen of projects in the area of software testing, and more specifically, in automated testing. It documents, analyzes and...
Stefan Berner, Roland Weber, Rudolf K. Keller
OOPSLA
2007
Springer
14 years 3 months ago
From developer's head to developer tests: characterization, theories, and preventing one more bug
Unit testing frameworks like JUnit are a popular and effective way to prevent developer bugs. We are investigating two ways of building on these frameworks to prevent more bugs wi...
David Saff
ACL
2006
13 years 10 months ago
Are These Documents Written from Different Perspectives? A Test of Different Perspectives Based on Statistical Distribution Dive
In this paper we investigate how to automatically determine if two document collections are written from different perspectives. By perspectives we mean a point of view, for examp...
Wei-Hao Lin, Alexander G. Hauptmann