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ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
14 years 16 days ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
LREC
2008
101views Education» more  LREC 2008»
13 years 9 months ago
Test Collections for Spoken Document Retrieval from Lecture Audio Data
The Spoken Document Processing Working Group, which is part of the special interest group of spoken language processing of the Information Processing Society of Japan, is developi...
Tomoyosi Akiba, Kiyoaki Aikawa, Yoshiaki Itoh, Tat...
SIGCSE
2004
ACM
112views Education» more  SIGCSE 2004»
14 years 1 months ago
Using software testing to move students from trial-and-error to reflection-in-action
Introductory computer science students rely on a trial and error approach to fixing errors and debugging for too long. Moving to a reflection in action strategy can help students ...
Stephen H. Edwards
SYNTHESE
2008
84views more  SYNTHESE 2008»
13 years 7 months ago
How experimental algorithmics can benefit from Mayo's extensions to Neyman-Pearson theory of testing
Although theoretical results for several algorithms in many application domains were presented during the last decades, not all algorithms can be analyzed fully theoretically. Exp...
Thomas Bartz-Beielstein
ITC
2002
IEEE
135views Hardware» more  ITC 2002»
14 years 16 days ago
Test Coverage: What Does It Mean When a Board Test Passes?
ct Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment that...
Kathy Hird, Kenneth P. Parker, Bill Follis