192 search results - page 24 / 39 » Functional Scan Chain Testing |
VTS
2000
IEEE
14 years 1 months ago
2000
IEEE
1 This paper addresses the problem of testing path delay faults in a microprocessor using instructions. It is observed that a structurally testable path (i.e., a path testable thro...
ACMSE
2008
ACM
13 years 11 months ago
2008
ACM
With stock surpluses and shortages representing one of the greatest elements of risk to wholesalers, a solution to the multiretailer supply chain management problem would result i...
BMCBI
2006
13 years 9 months ago
2006
Background: The subcellular location of a protein is closely related to its function. It would be worthwhile to develop a method to predict the subcellular location for a given pr...
BMCBI
2007
13 years 9 months ago
2007
Background: With the popularisation of high-throughput techniques, the need for procedures that help in the biological interpretation of results has increased enormously. Recently...
VTS
2005
IEEE
14 years 2 months ago
2005
IEEE
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...