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192
search results - page 7 / 39
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Functional Scan Chain Testing
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ICCD
2006
IEEE
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RTL Scan Design for Skewed-Load At-speed Test under Power Constraints
14 years 6 months ago
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iccd.et.tudelft.nl
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
Ho Fai Ko, Nicola Nicolici
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21
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ICCAD
1993
IEEE
77
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ICCAD 1993
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Reconfigurable scan chains: a novel approach to reduce test application time
14 years 1 months ago
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poisson.usc.edu
Sridhar Narayanan, Melvin A. Breuer
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ICCAD
1992
IEEE
96
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ICCAD 1992
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Configuring multiple scan chains for minimum test time
14 years 1 months ago
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poisson.usc.edu
Sridhar Narayanan, Rajesh Gupta, Melvin A. Breuer
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ATS
2001
IEEE
70
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ATS 2001
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Test Scheduling and Scan-Chain Division under Power Constraint
14 years 22 days ago
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www.ida.liu.se
Erik Larsson, Zebo Peng
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TODAES
2008
42
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TODAES 2008
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Layout-aware scan chain reorder for launch-off-shift transition test coverage
13 years 9 months ago
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vlsilab.cs.nchu.edu.tw
Sying-Jyan Wang, Kuo-Lin Peng, Kuang-Cyun Hsiao, K...
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