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ICCAD
1992
IEEE

Configuring multiple scan chains for minimum test time

14 years 4 months ago
Configuring multiple scan chains for minimum test time
Sridhar Narayanan, Rajesh Gupta, Melvin A. Breuer
Added 10 Aug 2010
Updated 10 Aug 2010
Type Conference
Year 1992
Where ICCAD
Authors Sridhar Narayanan, Rajesh Gupta, Melvin A. Breuer
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