123 search results - page 10 / 25 » Functional Test Generation for FSMs by Fault Extraction |
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ATS
2003
IEEE
14 years 24 days ago
2003
IEEE
A new technique for synthesizing totally symmetric Boolean functions is presented that achieves complete robust path delay fault testability. We apply BDDs for the synthesis of sy...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
Symbolic state space exploration techniques for Finite State Machines (FSMs) are a major recent result in CAD for VLSI. Most of them are exact and based on forward traversal, but ...
ISESE
2002
IEEE
14 years 12 days ago
2002
IEEE
Recent software systems contain a lot of functions to provide various services. According to this tendency, software testing becomes more difficult than before and cost of testing...