123 search results - page 9 / 25 » Functional Test Generation for FSMs by Fault Extraction |
DATE
2002
IEEE
14 years 13 days ago
2002
IEEE
This paper develops an improved approach for hierarchical functional test generation for complex chips. In order to deal with the increasing complexity of functional test generati...
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
ICTAI
2002
IEEE
14 years 12 days ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
ITC
1995
IEEE
13 years 11 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
GI
2007
Springer
14 years 1 months ago
2007
Springer
: A strategy for automatic test case selection based on the use of a similarity function is presented. Test case selection is a crucial activity to model-based testing since the nu...