174 search results - page 13 / 35 » Functional Test Generation for Full Scan Circuits |
PRL
1998
13 years 10 months ago
1998
A single parameter value that represents the difference between the original and the digitized characters is determined from a binary scan of a test chart. It represents the combi...
DAC
1999
ACM
14 years 3 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
ITC
1998
IEEE
14 years 3 months ago
1998
IEEE
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
DT
2002
13 years 10 months ago
2002
This article presents an in-circuit emulation (ICE) module that can be embedded with a microprocessr core. The ICE module, based on the IEEE 1149.1 JTAG architecture, supports typ...
FCCM
2009
IEEE
14 years 5 months ago
2009
IEEE
BLASTn is a tool universally used by biologists to identify similarities between nucleotide based biological genome sequences. This report describes an FPGA based hardware impleme...