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IASTEDSE
2004
13 years 9 months ago
A symbolic Java virtual machine for test case generation
Quality management is becoming a more and more important part of the software development process. As software testing is currently understood as the core function of the quality ...
Roger A. Müller, Christoph Lembeck, Herbert K...
VTS
2005
IEEE
96views Hardware» more  VTS 2005»
14 years 1 months ago
Pseudo-Functional Scan-based BIST for Delay Fault
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng
DAC
1998
ACM
14 years 8 months ago
Functional Vector Generation for HDL Models Using Linear Programming and 3-Satisfiability
Abstract-Our strategy for automatic generation of functional vectors is based on exercising selected paths in the given hardware description language (HDL) model. The HDL model des...
Farzan Fallah, Srinivas Devadas, Kurt Keutzer
ENTCS
2008
106views more  ENTCS 2008»
13 years 7 months ago
Verifying Test-Hypotheses: An Experiment in Test and Proof
HOL-TestGen is a specification and test case generation environment extending the interactive theorem prover Isabelle/HOL. The HOL-TestGen method is two-staged: first, the origina...
Achim D. Brucker, Lukas Brügger, Burkhart Wol...
ISSRE
2006
IEEE
14 years 1 months ago
BPEL4WS Unit Testing: Test Case Generation Using a Concurrent Path Analysis Approach
BPEL is a language that could express complex concurrent behaviors. This paper presents a novel method of BPEL test case generation, which is based on concurrent path analysis. Th...
Jun Yan, Zhong Jie Li, Yuan Yuan, Wei Sun, Jian Zh...