82 search results - page 15 / 17 » Functional Testing of Microprocessors with Graded Fault Cove... |
MTV
2006
IEEE
14 years 25 days ago
2006
IEEE
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
APCSAC
2004
IEEE
13 years 10 months ago
2004
IEEE
As device sizes continue shrinking, lower charges are needed to activate gates, and consequently ever smaller external events (such as single ionizing particles of naturally occurr...
ITC
2003
IEEE
14 years 3 days ago
2003
IEEE
–This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST_PULSE tests...
ISESE
2006
IEEE
14 years 25 days ago
2006
IEEE
Effective testing of safety-critical real-time embedded software is difficult and expensive. Many companies are hesitant about the cost of formalized criteria-based testing and a...
IEEEPACT
2008
IEEE
14 years 1 months ago
2008
IEEE
Technology scaling in integrated circuits has consistently provided dramatic performance improvements in modern microprocessors. However, increasing device counts and decreasing o...