82 search results - page 9 / 17 » Functional Testing of Microprocessors with Graded Fault Cove... |
TVLSI
2008
13 years 7 months ago
2008
With increasing levels of integration of multiple processing cores and new features to support software functionality, recent generations of microprocessors face difficult validati...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...
DAC
1999
ACM
13 years 11 months ago
1999
ACM
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
ISSRE
2006
IEEE
14 years 1 months ago
2006
IEEE
—Graphical user interfaces (GUIs) are used as front ends to most of today’s software applications. The event-driven nature of GUIs presents new challenges for testing. One impo...