2076 search results - page 359 / 416 » Functional logic overloading |
ATS
2003
IEEE
14 years 2 months ago
2003
IEEE
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
DFT
2003
IEEE
14 years 2 months ago
2003
IEEE
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
HICSS
2003
IEEE
14 years 2 months ago
2003
IEEE
Robust and resilient interconnected structures rely on decision procedures, both under uncertainty and multicriteria. In decision under uncertainty, we aim at finding a scoring p...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
RSP
2003
IEEE
14 years 2 months ago
2003
IEEE
The paper shows the outlines of the SLAM system and how its design is suitable for automating rapid prototyping. The system includes a very expressive object oriented specificati...