138 search results - page 21 / 28 » Functional test generation for delay faults in combinational... |
DATE
1999
IEEE
14 years 5 hour ago
1999
IEEE
Boolean Satisfiability is a ubiquitous modeling tool in Electronic Design Automation, It finds application in test pattern generation, delay-fault testing, combinational equivalen...
ATS
1998
IEEE
13 years 12 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
VTS
1999
IEEE
13 years 12 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
EURODAC
1995
IEEE
13 years 11 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...