14071 search results - page 2675 / 2815 » Fundamentals of simulation modeling |
ICCAD
2007
IEEE
14 years 7 months ago
2007
IEEE
— Starting at the 65nm node, stress engineering to improve performance of transistors has been a major industry focus. An intrinsic stress source – shallow trench isolation –...
ICCAD
2003
IEEE
14 years 7 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
ICCAD
2003
IEEE
14 years 7 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
IUI
2010
ACM
14 years 7 months ago
2010
ACM
Most of the previous work on non-invasive brain-computer interfaces (BCIs) has been focused on feature extraction and classification algorithms to achieve high performance for the...
EVOW
2010
Springer
14 years 5 months ago
2010
Springer
DEODHAR, SUSHAMNA DEODHAR. Using Grammatical Evolution Decision Trees for Detecting Gene-Gene Interactions in Genetic Epidemiology. (Under the direction of Dr. Alison Motsinger-Re...