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DAC
2007
ACM
14 years 10 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2002
ACM
14 years 10 months ago
Scheduler-based DRAM energy management
Previous work on DRAM power-mode management focused on hardware-based techniques and compiler-directed schemes to explicitly transition unused memory modules to low-power operatin...
Victor Delaluz, Anand Sivasubramaniam, Mahmut T. K...
ICCAD
2005
IEEE
147views Hardware» more  ICCAD 2005»
14 years 6 months ago
NoCEE: energy macro-model extraction methodology for network on chip routers
In this paper we present NoCEE, a fast and accurate method for extracting energy models for packet-switched Network on Chip (NoC) routers. Linear regression is used to model the r...
Jeremy Chan, Sri Parameswaran
ISORC
2009
IEEE
14 years 4 months ago
Component Based Middleware-Synthesis for AUTOSAR Basic Software
Distributed real-time automotive embedded systems have to be highly dependable as well as cost-efficient due to the large number of manufactured units. To close the gap between r...
Dietmar Schreiner, Markus Schordan, Karl M. Gö...
IMC
2009
ACM
14 years 4 months ago
IXPs: mapped?
Internet exchange points (IXPs) are an important ingredient of the Internet AS-level ecosystem—a logical fabric of the Internet made up of about 30,000 ASes and their mutual bus...
Brice Augustin, Balachander Krishnamurthy, Walter ...