18 search results - page 2 / 4 » GATTO: An Intelligent Tool for Automatic Test Pattern Genera... |
VLSID
2007
IEEE
14 years 7 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...
DAC
1999
ACM
13 years 11 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
ATS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
CONSTRAINTS
2007
13 years 6 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...