337 search results - page 13 / 68 » GCIP: exploiting the generation and optimization of integrat... |
ICDE
2001
IEEE
14 years 9 months ago
2001
IEEE
Semi-join reducers were introduced in the late seventies as a means to reduce the communication costs of distributed database systems. Subsequent work in the eighties showed, howe...
ASPLOS
2006
ACM
13 years 11 months ago
2006
ACM
This paper proposes new network interface controller (NIC) designs that take advantage of integration with the host CPU to provide increased flexibility for operating system kerne...
EVOW
2001
Springer
14 years 1 days ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
AIEDAM
2007
13 years 7 months ago
2007
Achieving the dimensional integrity for a complex structural assembly is a demanding task due to the manufacturing variations of parts and the tolerance relationship between them....