694 search results - page 56 / 139 » Gate Sizing Using a Statistical Delay Model |
ICCAD
2004
IEEE
14 years 6 months ago
2004
IEEE
In this paper, we have analyzed ond modeled the fiilure probabilities ofSRAM cells due to process parameter variations. A method to predict the yield of a memoiy chip based on the...
ICUMT
2009
13 years 6 months ago
2009
In this paper, we derive the explicit series expansion of the eigenvalue distribution of various models, namely the case of non-central Wishart distributions as well as one sided c...
CORR
2011
Springer
13 years 24 days ago
2011
Springer
We propose a logical/mathematical framework for statistical parameter learning of parameterized logic programs, i.e. de nite clause programs containing probabilistic facts with a ...
DAC
1999
ACM
14 years 1 months ago
1999
ACM
As interconnect feature sizes continue to scale to smaller dimensions, long interconnect can dominate the IC timing performance, but the interconnect parameter variations make it ...
SDM
2009
SIAM
14 years 6 months ago
2009
SIAM
In this paper, we study efficient closed pattern mining in a general framework of set systems, which are families of subsets ordered by set-inclusion with a certain structure, pro...