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ISCAS
2007
IEEE
92views Hardware» more  ISCAS 2007»
14 years 1 months ago
A Study on Impact of Leakage Current on Dynamic Power
— Scaling of CMOS technologies has led to dramatic increase in sub-threshold, gate and reverse biased junction band-to-band-tunneling (BTBT) leakage. Leakage current has now beco...
Ashesh Rastogi, Kunal P. Ganeshpure, Sandip Kundu
MSE
1999
IEEE
204views Hardware» more  MSE 1999»
13 years 11 months ago
A PC-based Educational Tool for CMOS Integrated Circuit Design
This paper presents a PC based software running on PC dedicated to the training in sub-micron CMOS VLSI design. The software firstly consists in a HDL-based schematic editor with ...
Etienne Sicard, Chen Xi
TCAD
2010
106views more  TCAD 2010»
13 years 5 months ago
Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies
—With the scaling of complementary metal–oxide– semiconductor (CMOS) technology into the nanometer regime, the overshooting effect due to the input-to-output coupling capacit...
Zhangcai Huang, Atsushi Kurokawa, Masanori Hashimo...
SBCCI
2004
ACM
100views VLSI» more  SBCCI 2004»
14 years 16 days ago
Design of RF CMOS low noise amplifiers using a current based MOSFET model
This paper presents a design methodology for RF CMOS Low Noise Amplifiers (LNA). This methodology uses a current–based MOSFET model, which allows a detailed analysis of an LNA f...
Virgínia Helena Varotto Baroncini, Oscar da...
SBCCI
2004
ACM
134views VLSI» more  SBCCI 2004»
14 years 16 days ago
An approach to computer simulation of bonding and package crosstalk in mixed-signal CMOS ICs
This paper presents an approach for simulation of mixed analog-digital CMOS integrated circuits, aiming at estimating crosstalk effects due to current pulses drawn from voltage s...
Gabriella Trucco, Giorgio Boselli, Valentino Liber...