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ISCAS
2007
IEEE
113views Hardware» more  ISCAS 2007»
14 years 1 months ago
Design Considerations for Future RF Circuits
TheRFdesignparadigm will changesignificantly asCMOS technology scales and integration levels rise to accommodate multi-band, multi-mode transceivers and baseband processors. This...
Behzad Razavi
CHES
2005
Springer
82views Cryptology» more  CHES 2005»
14 years 1 months ago
Masking at Gate Level in the Presence of Glitches
Abstract. It has recently been shown that logic circuits in the implementation of cryptographic algorithms, although protected by “secure” random masking schemes, leak side-cha...
Wieland Fischer, Berndt M. Gammel
ASPDAC
2006
ACM
135views Hardware» more  ASPDAC 2006»
14 years 1 months ago
Robust analytical gate delay modeling for low voltage circuits
— Sakurai-Newton (SN) delay metric [1] is a widely used closed form delay metric for CMOS gates because of simplicity and reasonable accuracy. Nevertheless it can be shown that t...
Anand Ramalingam, Sreekumar V. Kodakara, Anirudh D...
TCAD
2008
120views more  TCAD 2008»
13 years 7 months ago
Charge Recycling in Power-Gated CMOS Circuits
Abstract--Design of a suitable power gating (e.g., multithreshold CMOS or super cutoff CMOS) structure is an important and challenging task in sub-90nm VLSI circuits where leakage ...
Ehsan Pakbaznia, Farzan Fallah, Massoud Pedram
ISLPED
2004
ACM
122views Hardware» more  ISLPED 2004»
14 years 27 days ago
Microarchitectural techniques for power gating of execution units
Leakage power is a major concern in current and future microprocessor designs. In this paper, we explore the potential of architectural techniques to reduce leakage through power-...
Zhigang Hu, Alper Buyuktosunoglu, Viji Srinivasan,...