1722 search results - page 24 / 345 » Generating Tests from Counterexamples |
ATS
1996
IEEE
14 years 2 months ago
1996
IEEE
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
ATS
2005
IEEE
14 years 3 months ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
SDL
2001
13 years 11 months ago
2001
The purpose of this paper is to describe how computer-aided test generation methods can benefit from the time features and extensions to MSC, SDL and TTCN which are either already ...
SAC
2006
ACM
13 years 10 months ago
2006
ACM
The objective of testing is to determine the conformance between a system and its specification. When testing distributed systems, the existence of multiple testers brings out the...
LOPSTR
2009
Springer
14 years 2 months ago
2009
Springer
In this paper, we propose an approach for automated test case generation based on techniques from constraint programming (CP). We advocate the use of standard CP search strategies ...