62 search results - page 5 / 13 » Generation of Integration Tests for Self-Testing Components |
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...
ACMSE
2006
ACM
14 years 1 months ago
2006
ACM
In this paper we consider the problem of automatically generating test suites associated with web-based enterprise systems. In particular, we discuss the construction of a tool de...
CORR
2010
Springer
13 years 7 months ago
2010
Springer
As one of the newest members in the field of artificial immune systems (AIS), the Dendritic Cell Algorithm (DCA) is based on behavioural models of natural dendritic cells (DCs). U...
ITC
2003
IEEE
14 years 22 days ago
2003
IEEE
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...
MSE
2003
IEEE
14 years 22 days ago
2003
IEEE
A tool has been created for use in a design course to automate integration of new components into a SystemOn-Chip (SoC). Students used this tool to implement a complete SoC Intern...