68 search results - page 2 / 14 » Generation of compact test sets with high defect coverage |
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...