68 search results - page 7 / 14 » Generation of compact test sets with high defect coverage |
ICCAD
1994
IEEE
13 years 11 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
COMPSAC
2010
IEEE
13 years 5 months ago
2010
IEEE
An important goal of automatic testing techniques, including random testing is to achieve high code coverage with a minimum set of test cases. To meet this goal, random testing res...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
SBCCI
2005
ACM
14 years 1 months ago
2005
ACM
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
ISSTA
2006
ACM
14 years 1 months ago
2006
ACM
The popularity of object-oriented programming has led to the wide use of container libraries. It is important for the reliability of these containers that they are tested adequate...