Modern processing technologies offer a number of types of devices such as high-VT , low-VT , thick-oxide, etc. in addition to the nominal transistor in order to meet system perfor...
Jintae Kim, Ritesh Jhaveri, Jason Woo, Chih-Kong K...
Circuit design under process variation can be formulated mathematically as a robust optimization problem with a yield constraint. Existing methods force designers to either resort...
Yu Ben, Laurent El Ghaoui, Kameshwar Poolla, Costa...
We present an efficient optimization scheme for gate sizing in the presence of process variations. Our method is a worst-case design scheme, but it reduces the pessimism involved i...
Jaskirat Singh, Zhi-Quan Luo, Sachin S. Sapatnekar