We consider the following "efficiently decodable" nonadaptive group testing problem. There is an unknown string x {0, 1}n with at most d ones in it. We are allowed to t...
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...
We observe that finding invalid signatures in batches of signatures that fail batch verification is an instance of the classical group testing problem. We present and compare new ...
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara
The classical and well-studied group testing problem is to find d defectives in a set of n elements by group tests, which tell us for any chosen subset whether it contains defectiv...