Sciweavers

809 search results - page 152 / 162
» Handling variations and uncertainties
Sort
View
GIS
2007
ACM
14 years 8 months ago
Robust location search from text queries
Robust, global, address geocoding is challenging because there is no single address format that applies to all geographies, and in any case, users may not restrict themselves to w...
Vibhuti S. Sengar, Tanuja Joshi, Joseph Joy, Samar...
DAC
2003
ACM
14 years 8 months ago
Efficient model order reduction including skin effect
Skin effect makes interconnect resistance and inductance frequency dependent. This paper addresses the problem of efficiently estimating the signal characteristics of any RLC netw...
Shizhong Mei, Chirayu S. Amin, Yehea I. Ismail
VLSID
2006
IEEE
150views VLSI» more  VLSID 2006»
14 years 7 months ago
A Comprehensive SoC Design Methodology for Nanometer Design Challenges
SoC design methodologies are under constant revision due to adoption of fast shrinking process technologies at nanometer levels. Nanometer process geometries exhibit new complex d...
R. Raghavendra Kumar, Ricky Bedi, Ramadas Rajagopa...
CVPR
2010
IEEE
14 years 3 months ago
Fast Image Alignment in the Fourier Domain
In this paper we propose a framework for gradient descent image alignment in the Fourier domain. Specifically, we propose an extension to the classical Lucas & Kanade (LK) a...
Ahmed Ashraf, Simon Lucey, Tsuhan Chen
DAC
2009
ACM
14 years 2 months ago
Clock skew optimization via wiresizing for timing sign-off covering all process corners
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...
Sari Onaissi, Khaled R. Heloue, Farid N. Najm