2062 search results - page 223 / 413 » Hardware Objects for Java |
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
ISQED
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper studies multi-dimensional optimization at both circuit and micro-architecture levels. By formulating and solving the optimization problem with conflicting design objec...
EH
2005
IEEE
14 years 3 months ago
2005
IEEE
Evolutionary Design has demonstrated great potential to automatically generate a wide array of novel, interesting, and human-competitive designs. Few of these evolved designs, how...
SI3D
2003
ACM
14 years 2 months ago
2003
ACM
Shadow mapping is a technique for doing real-time shadowing. Recent work has shown that shadow mapping hardware can be used as a second depth test in addition to the z-test. In th...
DATE
2000
IEEE
14 years 2 months ago
2000
IEEE
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...