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ISQED
2003
IEEE
85views Hardware» more  ISQED 2003»
14 years 2 months ago
Static Pin Mapping and SOC Test Scheduling for Cores with Multiple Test Sets
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanja...
ISQED
2003
IEEE
119views Hardware» more  ISQED 2003»
14 years 2 months ago
System and Framework for QA of Process Design Kits
In this paper, we evaluate the dependencies between tools, data and environment in process design kits, and present a framework for systematically analyzing the quality of the des...
M. C. Scott, M. O. Peralta, Jo Dale Carothers
ITC
2003
IEEE
109views Hardware» more  ITC 2003»
14 years 2 months ago
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data
While the IEEE P1500 standards working group is on the verge of recommending a standard test interface for "non-mergeable" cores, a need was felt to adopt a standard met...
Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh,...
DATE
2010
IEEE
124views Hardware» more  DATE 2010»
14 years 2 months ago
Reuse-aware modulo scheduling for stream processors
—This paper presents reuse-aware modulo scheduling to maximizing stream reuse and improving concurrency for stream-level loops running on stream processors. The novelty lies in t...
Li Wang, Jingling Xue, Xuejun Yang
DATE
2002
IEEE
104views Hardware» more  DATE 2002»
14 years 2 months ago
A Compiler-Based Approach for Improving Intra-Iteration Data Reuse
Intra-iteration data reuse occurs when multiple array references exhibit data reuse in a single loop iteration. An optimizing compiler can exploit this reuse by clustering (in the...
Mahmut T. Kandemir