251 search results - page 39 / 51 » Hierarchical Modeling and Simulation of Large Analog Circuit... |
IJCNN
2006
IEEE
14 years 3 months ago
2006
IEEE
— In recent years, many people have been trying to develop some applications to information processing by exploiting oscillatory phenomena in neural networks. Bifurcation and sta...
ISQED
2008
IEEE
14 years 4 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
VLSID
2010
IEEE
13 years 3 months ago
2010
IEEE
The continuous increase of leakage power consumption
in deep sub-micro technologies necessitates more aggressive
leakage control. Runtime leakage control (RTLC) is effective,
si...
PAMI
2010
13 years 8 months ago
2010
—In this paper we present a compositional and dynamic model for face aging. The compositional model represents faces in each age group by a hierarchical And-Or graph, in which An...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
With aggressive gate oxide scaling, latent defects in the gate oxide manifest as traps that, in time, lead to gate oxide breakdown. Progressive gate oxide breakdown, also referred...