128 search results - page 19 / 26 » High Resolution Scalable Displays: Manufacturing and Use |
MR
2010
13 years 6 months ago
2010
Industrial applications often require failure analysis methods working non-destructively, enabling either a rapid quality control or fault isolation and defect localization prior ...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
As integrated circuits manufacturing technology is advancing into 65nm and 45nm nodes, extensive resolution enhancement techniques (RETs) are needed to correctly manufacture a chip...
HIPC
2005
Springer
14 years 1 months ago
2005
Springer
Abstract. Parallelizing a sequential algorithm—i.e., manually or automatically converting it into an equivalent parallel distributed algorithm—is an important problem. Ideally,...
DAGSTUHL
2010
13 years 9 months ago
2010
Visualizations are well suited to communicate large amounts of complex data. With increasing resolution in the spatial and temporal domain simple imaging techniques meet their lim...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...